Instruct: Given the title of a paper, retrieve paper titles that are cited by the given paper
Query: Active ESD protection for input transistors in a 40-nm CMOS process
Power-Rail ESD Clamp Circuit With Diode-String ESD Detection to Overcome the Gate Leakage Current in a 40-nm CMOS Process
Novel electrostatic discharge (ESD) protection solution in GaAs pHEMT technology
Design on the low-leakage diode string for using in the power-rail ESD clamp circuits in a 0.35-/spl mu/m silicide CMOS process
Area-efficient transient power-rail electrostatic discharge clamp circuit with mis-triggering immunity in a 65-nm CMOS process
A technique to improve the drive current of high-voltage I/O transistors in digital CMOS technologies
A study of impacts of ESD protection on 28/38GHz RF switches in 45nm SOI CMOS for 5G mobile applications
Dependence of Device Structures on Latchup Immunity in a High-Voltage 40-V CMOS Process With Drain-Extended MOSFETs
Current filament movement and silicon melting in an ESD-robust DENMOS transistor
ESD protection circuit schemes for DDR3 DQ drivers
Diode-triggered SCR (DTSCR) for RF-ESD protection of BiCMOS SiGe HBTs and CMOS ultra-thin gate oxides
Self-Substrate-Triggered Technique to Enhance Turn-On Uniformity of Multi-Finger ESD Protection Devices
A double RESURF LDMOS with drain profile engineering for improved ESD robustness
22-nm fully-depleted tri-gate CMOS transistors
ESD Design Strategies for High-Speed Digital and RF Circuits in Deeply Scaled Silicon Technologies
Substrate Modeling and Lumped Substrate Resistance Extraction for CMOS ESD/Latchup Circuit Simulation
Novel Silicon-Controlled Rectifier (SCR) for High-Voltage Electrostatic Discharge (ESD) Applications
Low-Jitter GaN E-HEMT Gate Driver With High Common-Mode Voltage Transient Immunity
Minimizing stand-by leakage power in static CMOS circuits
Improved single-event hardness of trench power MOSFET with a widened split gate
Concurrent Design Analysis of High-Linearity SP10T Switch With 8.5 kV ESD Protection
Impedance analysis of automotive high voltage networks for EMC measurements
A modeling capacity of vertebral fractures exists during growth - an up to 47-year follow-up
Plug-and-Play priors for model based reconstruction
Novel clamp circuits for IC power supply protection
urban emotions - geo - semantic emotion extraction from technical sensors , human sensors and crowdsourced data .