Instruct: Given the title of a scientific paper, retrieve paper titles that are cited by the given paper
Query: Hybrid data mining approach for pattern extraction from wafer bin map to improve yield in semiconductor manufacturing
data mining for yield enhancement in semiconductor manufacturing and an empirical study .
Application of machine learning methods in post-silicon yield improvement
Big Data and Predictive Analytics Methods for Modeling and Analysis of Semiconductor Manufacturing Processes
Cycle-Time Key Factor Identification and Prediction in Semiconductor Manufacturing Using Machine Learning and Data Mining
Wafer Map Defect Detection and Recognition Using Joint Local and Nonlocal Linear Discriminant Analysis
Decision Tree Ensemble-Based Wafer Map Failure Pattern Recognition Based on Radon Transform-Based Features
Defect cluster recognition system for fabricated semiconductor wafers
Data Mining of Printed-Circuit Board Defects
Detection of Spatial Defect Patterns Generated in Semiconductor Fabrication Processes
Statistics in Semiconductor Test: Going beyond Yield
Identifying systematic spatial failure patterns through wafer clustering
Wafer defect patterns recognition based on OPTICS and multi-label classification
Big data analytics for modeling WAT parameter variation induced by process tool in semiconductor manufacturing and empirical study
Classification of Defect Clusters on Semiconductor Wafers Via the Hough Transformation
Predictive Maintenance in semiconductor manufacturing
Wafer defect pattern recognition by multi-class support vector machines by using a novel defect cluster index
A hybrid OLAP-association rule mining based quality management system for extracting defect patterns in the garment industry
SIMULATION BASED CAUSE AND EFFECT ANALYSIS IN SEMICONDUCTOR WAFER FABRICATION
Setting quality control requirements to balance between Cycle Time and Yield in a semiconductor production line
Testing of Copper Pillar Bumps for Wafer Sort
EvoRiver: Visual Analysis of Topic Coopetition on Social Media
Get real in individual participant data (IPD) meta‐analysis: a review of the methodology
A short survey on bloom filter and its variants
annotated corpus for supervised email summarization .
Data clustering: a review