Instruct: Given a paper title, retrieve paper titles that are cited by the given paper
Query: Detection of Spatial Defect Patterns Generated in Semiconductor Fabrication Processes
Bayesian spatial defect pattern recognition in semiconductor fabrication using support vector clustering
Layout Decomposition Approaches for Double Patterning Lithography
Automatic visual inspection and defect detection on variable data prints
Enhancing thin dielectric remaining detection under polysilico plug of advanced DRAM by electron beam inspection
Maskless Grayscale Lithography Using a Positive-Tone Photodefinable Polyimide for MEMS Applications
e-Manufacturing System for Next-generation Semiconductor Production
Effective two-dimensional pattern generation for self-aligned double patterning
Automated vision system for fabric defect inspection using Gabor filters and PCNN
automatic pcb defect detection using image subtraction method .
Advanced Dicing Technology for Semiconductor Wafer—Stealth Dicing
Automatic visual inspection of printed circuit board for defect detection and classification
Improved grayscale lithography
A virtual metrology system for semiconductor manufacturing
Automatic detection of Mura defect in TFT-LCD based on regression diagnostics
Benchmarking semiconductor manufacturing
An algorithm for classification of five types of defects on bare printed circuit board
Automated PCB inspection in small series production based on SIFT algorithm
Laser grooving characterization for dicing defects reduction and its challenges
Radiation-induced soft errors in advanced semiconductor technologies
Testing of Copper Pillar Bumps for Wafer Sort
Multi-Objective Optimization of 50 kW/85 kHz IPT System for Public Transport
Biplanar Temple Lift for Lateral Brow Ptosis: Comparison with Uniplanar Dissection Technique
Frontal Silent Sinus Syndrome
Support Vector Clustering
Deadlock-FreeMessage Routing inMultiprocessor Interconnection Networks