Instruct: Given a paper title, retrieve paper titles that are cited by the given paper
Query: Demonstration of MOS capacitor measurement for wafer manufacturing using a Direct Charge Measurement
Correlation between Direct Charge Measurement (DCM) and LCR meter on deep submicron CMOS test structure capacitance measurement
Implementation of MOSFET based capacitors for digital applications
CMOS circuit testing via time-resolved luminescence measurements and simulations
An Experimental Demonstration of GaN CMOS Technology
MOS Capacitor Deep Trench Isolation for CMOS image sensors
Non-uniformity of wafer and pad in CMP: kinematic aspects of view
Nano-probing station incorporating MEMS probes for 1D device RF on-wafer characterization
Electrostatic chuck with a thin ceramic insulation layer for wafer holding
AC Transconductance Dispersion (ACGD): A Method to Profile Oxide Traps in MOSFETs Without Body Contact
Warpage Measurements and Characterizations of Fan-Out Wafer-Level Packaging with Large Chips and Multiple Redistributed Layers
A cross-coupled common centroid test structures layout method for high precision MIM capacitor mismatch measurements
A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large MOSFET Arrays
A virtual metrology system for semiconductor manufacturing
Review of wafer dicing techniques for via-middle process 3DI/TSV ultrathin silicon device wafers
Modeling of a Silicon-Carbide MOSFET With Focus on Internal Stray Capacitances and Inductances, and its Verification
Testing of Copper Pillar Bumps for Wafer Sort
Electrical Characterization of Defects in Gate Dielectrics
Warpage Study of Large 2.5D IC Chip Module
MEMS Vertical Probe Cards With Ultra Densely Arrayed Metal Probes for Wafer-Level IC Testing
Using S-parameter measurements to determine the threshold voltage, gain factor, and mobility degradation factor for microwave bulk-MOSFETs
Survey on Fairness Issues in TCP Congestion Control Mechanisms
EEG-Based Emotion Recognition Using Deep Learning Network with Principal Component Based Covariate Shift Adaptation
Charge-based capacitance measurement for bias-dependent capacitance
color image segmentation using k - means clustering and otsu ’ s adaptive thresholding .
Commutativity, Associativity, and Public Key Cryptography