Instruct: Given the title of a paper, retrieve paper titles that are cited by the given paper.
Query: Randomized General Regression Network for Identification of Defect Patterns in Semiconductor Wafer Maps
Automatic Identification of Defect Patterns in Semiconductor Wafer Maps Using Spatial Correlogram and Dynamic Time Warping
Detection of Spatial Defect Patterns Generated in Semiconductor Fabrication Processes
Wafer defect pattern recognition by multi-class support vector machines by using a novel defect cluster index
Classification of Defect Clusters on Semiconductor Wafers Via the Hough Transformation
Bayesian spatial defect pattern recognition in semiconductor fabrication using support vector clustering
Evolutionary Fuzzy ARTMAP Neural Networks for Classification of Semiconductor Defects
Defect cluster recognition system for fabricated semiconductor wafers
NEURAL NETWORK PARADIGM FOR CLASSIFICATION OF DEFECTS ON PCB
Identifying systematic spatial failure patterns through wafer clustering
Automated Defect Inspection Systems by Pattern Recognition
Machine learning for mask/wafer hotspot detection and mask synthesis
Data Mining of Printed-Circuit Board Defects
Automated Pattern Recognition and Defect Inspection System
Half-CNN: A General Framework for Whole-Image Regression
Automatically learning semantic features for defect prediction
Fully Convolutional Networks for Surface Defect Inspection in Industrial Environment
Automatic detection of Mura defect in TFT-LCD based on regression diagnostics
Deformable Patterned Fabric Defect Detection With Fisher Criterion-Based Deep Learning
High Performance Lithography Hotspot Detection With Successively Refined Pattern Identifications and Machine Learning
MATLAB based defect detection and classification of printed circuit board
A supervised machine learning link prediction approach for academic collaboration recommendation
Support Vector Machines for Multi-Class Pattern Recognition
Coherent receiver for AIS satellite detection
Finding best-fitted rectangle for regions using a bisection method
POSTECH's U-Health Smart Home for elderly monitoring and support