Instruct: Given a scientific paper title, retrieve paper titles that are cited by the given paper.
Query: Reliability investigations on the programming currents of 28nm metal e-Fuse
Reliability Qualification of CoSi2 Electrical Fuse for 90Nm Technology
Failure analysis on the standby current due to dislocation in STI structure of flash memory
Survey of Solid-State Fault Current Limiters
Analysis of electromigration for Cu pillar bump in flip chip package
Current filament movement and silicon melting in an ESD-robust DENMOS transistor
ESD device performance analysis in a 14nm FinFET SOI CMOS technology: Fin-based versus planar-based
Fault tolerant methods for reliability in FPGAs
Boolean Difference Based Reliability Evaluation of Fault-Tolerant Circuit Structures on FPGAs
Design and analysis of metastable-hardened flip-flops in sub-threshold region
Reliability evaluation of copper (Cu) through-silicon via (TSV) barrier and dielectric liner by electrical characterization
Investigation on the layout strategy of ggNMOS ESD protection devices for uniform conduction behavior and optimal width scaling
Impact of Inner Pickup on ESD Robustness of Multifinger MOSFET in 28-nm High- $k$/Metal Gate CMOS Process
Study of fast initial charge loss and it's impact on the programmed states Vt distribution of charge-trapping NAND Flash
Current Status of Reliability in Extended and Beyond CMOS Devices
SOLDER JOINT RELIABILITY ANALYSIS AND TESTING OF A DUAL ROW QFN PACKAGE
Design of Gate-Ground-NMOS-Based ESD Protection Circuits with Low Trigger Voltage, Low Leakage Current, and Fast Turn-On
Reliability of E/D PHEMT process for control circuit applications
Reliability study on cobalt and ruthenium as alternative metals for advanced interconnects
ON THE DESIGN AND CHARACTERIZATION OF FEMTOAMPERE CURRENT-MODE CIRCUITS
Gate sizing: finFETs vs 32nm bulk MOSFETs
A PROM element based on salicide agglomeration of poly fuses in a CMOS logic process
A Bit-Serial Approximate Min-SumLDPCDecoder and FPGAImplementation
Management of deformational plagiocephaly: Repositioning versus orthotic therapy
Action Recognition from RGB-D Data: Comparison and Fusion of Spatio-Temporal Handcrafted Features and Deep Strategies
Analysis of short circuit type II and III of high voltage SiC MOSFETs with fast current source gate drive principle