Instruct: Given the title of a paper, retrieve paper titles that are cited by the given paper.
Query: A virtual metrology system for semiconductor manufacturing
Application development of virtual metrology in semiconductor industry
On the corrupting influence of variability in semiconductor manufacturing
control of lithography in semiconductor manufacturing .
Integration of scheduling and advanced process control in semiconductor manufacturing: review and outlook
A methodology for the verification of a "system on chip"
An intelligent system for wafer bin map defect diagnosis: An empirical study for semiconductor manufacturing
Development Kits for 3 D Optical Metrology Systems
A Comprehensive Big-Data-Based Monitoring System for Yield Enhancement in Semiconductor Manufacturing
Deep learning for virtual metrology: Modeling with optical emission spectroscopy data
Computer-aided system for defect inspection in the PCB manufacturing process
Predictive Maintenance in semiconductor manufacturing
Scheduling semiconductor wafer fabrication
A profile measurement system for rail manufacturing using multiple laser range finders
Setting quality control requirements to balance between Cycle Time and Yield in a semiconductor production line
Calibrating On-Wafer Probes to the Probe Tips
Defect cluster recognition system for fabricated semiconductor wafers
SIMULATION BASED CAUSE AND EFFECT ANALYSIS IN SEMICONDUCTOR WAFER FABRICATION
A survey of automated material handling systems in 300-mm SemiconductorFabs
Through silicon via technology — processes and reliability for wafer-level 3D system integration
Detection of Spatial Defect Patterns Generated in Semiconductor Fabrication Processes
Public health, GIS, and spatial analytic tools.
Digital Libraries and Multimedia Archives
Sequential Attention
fast training of support vector machines using sequential minimal optimization , advances in kernel methods .
The Quest to Replace Passwords: A Framework for Comparative Evaluation of Web Authentication Schemes