Instruct: Given the title of a scientific paper, retrieve paper titles that are cited by the given paper.
Query: eFuse Design and Reliability
Reliability Qualification of CoSi2 Electrical Fuse for 90Nm Technology
ESD Design Strategies for High-Speed Digital and RF Circuits in Deeply Scaled Silicon Technologies
Ferroelectric random access memory (FRAM) fatigue test with Arduino and Raspberry Pi
GDNMOS design for ESD protection in submicron CMOS VLSI
Reliability of Cu pillar bumps for flip-chip packages with ultra low-k dielectrics
Analysis of electromigration for Cu pillar bump in flip chip package
Layout styles to improve CDM ESD robustness of integrated circuits in 65-nm CMOS process
Fan-Out Chip on Substrate Device Interconnection Reliability Analysis
Issues in fatigue life prediction model for underfilled flip chip bump
Ultra-fast programming of silicided polysilicon fuses based on new insights in the programming physics
Comparative Study of Reliability of Ferroelectric and Anti-Ferroelectric Memories
A PROM element based on salicide agglomeration of poly fuses in a CMOS logic process
electronic circuit reliability modeling .
A survey of circuit innovations in ferroelectric random-access memories
Fault tolerant methods for reliability in FPGAs
Performance analysis of a memristive crossbar PUF design
Ultralow-Voltage Process-Variation-Tolerant Schmitt-Trigger-Based SRAM Design
Degradation of floating-gate memory reliability by few electron phenomena
ESD protection design in a-IGZO TFT technologies
Circuit and Layout Co-Design for ESD Protection in Bipolar-CMOS-DMOS (BCD) High-Voltage Process
Advanced QFN packaging for low cost and solution
{DR}. {CHECKER}: A Soundy Analysis for Linux Kernel Drivers
Real-time lens blur effects and focus control
A PROM element based on salicide agglomeration of poly fuses in a CMOS logic process
Perspectives on Cognitive Informatics and Cognitive Computing