Instruct: Given a scientific paper title, retrieve paper titles that are cited by the given paper
Query: Identifying systematic spatial failure patterns through wafer clustering
Randomized General Regression Network for Identification of Defect Patterns in Semiconductor Wafer Maps
Methodologies for fast yield ramp with limited engineering resources utilizing Inline Defect data overlay to SRAM Bitmap failure and Logic Diagnostics
SIMULATION BASED CAUSE AND EFFECT ANALYSIS IN SEMICONDUCTOR WAFER FABRICATION
Spatial disease clusters: Detection and inference
PCB Defect Detection, Classification and Localization using Mathematical Morphology and Image Processing Tools
Efficient software-based fault isolation
Fuzzy c-means clustering with spatial information for image segmentation
Learning Tractable Probabilistic Models for Fault Localization
Efficient circuit clustering for area and power reduction in FPGAs
Warpage Measurements and Characterizations of Fan-Out Wafer-Level Packaging with Large Chips and Multiple Redistributed Layers
Robust clustering in arbitrarily oriented subspaces
Weighted cluster ensembles: Methods and analysis
Robust clustering methods: a unified view
Web document clustering: a feasibility demonstration
The semantics of clustering: analysis of user-generated spatializations of text documents
Fingerprinting the datacenter: automated classification of performance crises
Visualization of test information to assist fault localization
Graph-theoretical methods for detecting and describing gestalt clusters
Spectral–Spatial Classification of Hyperspectral Imagery Based on Partitional Clustering Techniques
Clustering Sensor Data for Terrain Identification using a Windowless Algorithm
Detection and Tracking of Multiple, Partially Occluded Humans by Bayesian Combination of Edgelet based Part Detectors
How many clusters? Which clustering method? Answers via model-based cluster analysis
Deep Learning Identity-Preserving Face Space
Surgery for posterior vaginal wall prolapse
General Image-Quality Equation: GIQE.