Instruct: Given a scientific paper title, retrieve paper titles that are cited by the given paper
Query: An On-Chip Temperature Sensor With a Self-Discharging Diode in 32-nm SOI CMOS
Smart integrated temperature sensor - mixed-signal circuits and systems in 32-nm and beyond
Ambient Temperature-Gradient Compensated Low-Drift Thermopile Flow Sensor
Temperature measurements of semiconductor devices - a review
A 2.6 nW, 0.45 V Temperature-Compensated Subthreshold CMOS Voltage Reference
Cryogenic Temperature Characterization of a 28-nm FD-SOI Dedicated Structure for Advanced CMOS and Quantum Technologies Co-Integration
Design and fabrication of Schottky diodes in 1.2 µm CMOS process
Self-heating in advanced CMOS technologies
DESIGN OF A CMOS BANDGAP REFERENCE CIRCUIT WITH A WIDE TEMPERATURE RANGE, HIGH PRECISION AND LOW TEMPERATURE COEFFICIENT
A Portable 2-Transistor Picowatt Temperature-Compensated Voltage Reference Operating at 0.5 V
A Low-ppm Digitally Controlled Crystal Oscillator Compensated by a New 0.19-mm2 Time-Domain Temperature Sensor
An ultra low power 1V, 220nW temperature sensor for passive wireless applications
Precision CMOS current reference with process and temperature compensation
A resistorless current reference source for 65 nm CMOS technology with low sensitivity to process, supply voltage and temperature variations
A Novel Wide-Temperature-Range, 3.9 ppm/$^{\circ}$C CMOS Bandgap Reference Circuit
A Thermal-Aware Device Design Considerations for Nanoscale SOI and Bulk FinFETs
A 2-nW 1.1-V self-biased current reference in CMOS technology
Impact of self-heating effect on long-term reliability and performance degradation in CMOS circuits
A temperature and process insensitive CMOS reference current generator
Differential Wide Temperature Range CMOS Interface Circuit for Capacitive MEMS Pressure Sensors
A temperature compensated relaxation oscillator for SoC implementations
Behavioral Finance: A Review and Synthesis
Situation Assessment of an Autonomous Emergency Brake for Arbitrary Vehicle-to-Vehicle Collision Scenarios
Learning From Demonstration in the Wild
A 45nmLogicTechnology withHigh-k+Metal GateTransistors, Strained Silicon, 9CuInterconnect Layers, 193nmDryPatterning, and100%Pb-free Packaging
Catastrophic Importance of Catastrophic Forgetting