Instruct: Given the title of a paper, retrieve paper titles that are cited by the given paper.
Query: Area-Efficient ESD-Transient Detection Circuit With Smaller Capacitance for On-Chip Power-Rail ESD Protection in CMOS ICs
Unexpected failure in power-rail ESD clamp circuits of CMOS integrated circuits in microelectronics systems during electrical fast transient (EFT) test and the re-design solution
Design of ESD Protection Device for $K\!/\!Ka$ -Band Applications in Nanoscale CMOS Process
Optimizing the performance of ESD circuit protection devices
CDM ESD protection design with initial-on concept in nanoscale CMOS process
A novel SCR structure integrated with power clamp for ESD protection at I/O pad
ESD Protection Design With On-Chip ESD Bus and High-Voltage-Tolerant ESD Clamp Circuit for Mixed-Voltage I/O Buffers
Circuit and Layout Co-Design for ESD Protection in Bipolar-CMOS-DMOS (BCD) High-Voltage Process
Overview of on-chip electrostatic discharge protection design with SCR-based devices in CMOS integrated circuits
ESD (Electrostatic Discharge) Protection Design for Nanoelectronics in CMOS Technology
Improvement of the electrical safe operating area of a DMOS transistor during ESD events
Field effect diode for effective CDM ESD protection in 45 nm SOI technology
GDNMOS design for ESD protection in submicron CMOS VLSI
A PNP-triggered SCR with improved trigger techniques for high-speed I/O ESD protection in deep sub-micron CMOS LSIs
A 2.4-GHz Fully Integrated ESD-Protected Low-Noise Amplifier in 130-nm PD SOI CMOS Technology
ESD protection for mixed-voltage I/O using NMOS transistors stacked in a cascode configuration
Bidirectional ESD Protection Device Using PNP With pMOS-Controlled Nwell Bias
Diode-based tuned ESD protection for 5.25-GHz CMOS LNAs
System-Level ESD Protection for Automotive Electronics by Co-Design of TVS and CAN Transceiver Chips
A circuit model of electrostatic discharge generators for ESD and EMC SPICE simulation
Native-NMOS-Triggered SCR With Faster Turn-On Speed for Effective ESD Protection in a 0.13-$rm murm m$CMOS Process
A Review on Performance Appraisal System: An Ineffective and Destructive Practice?
Formal verification of ethical choices in autonomous systems
learning from labeled and unlabeled data with labelpropagationxiaojin .
Novel clamp circuits for IC power supply protection
Information Security: End User Behavior and Corporate Culture